Information card for entry 1575428

Structure parameters

• Formula: C24.4 H14 Cl0.4 F4.8 S2 Sb0.8
• Calculated formula: C24.4 H14 Cl0.4 F4.8 S2 Sb0.8
• Title of publication: Radical cation salts of dinaphtho[2,3-b:2′,3′-f]thieno[3,2-b]thiophene: characteristic crystal structures and properties
• Authors of publication: Dhara, Barun; Bulgarevich, Kirill; Takimiya, Kazuo
• Journal of publication: CrystEngComm
• Year of publication: 2025
• Journal volume: 27
• Journal issue: 38
• Pages of publication: 6333 - 6340
• a: 14.9609 ± 0.0003 Å
• b: 17.5144 ± 0.0002 Å
• c: 21.7009 ± 0.0005 Å
• α: 88.523 ± 0.002°
• β: 72.579 ± 0.002°
• γ: 84.107 ± 0.001°
• Cell volume: 5396.74 ± 0.19 ų
• Cell temperature: 300 K
• Ambient diffraction temperature: 300 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.1027
• Residual factor for significantly intense reflections: 0.0848
• Weighted residual factors for significantly intense reflections: 0.2025
• Weighted residual factors for all reflections included in the refinement: 0.2142
• Goodness-of-fit parameter for all reflections included in the refinement: 1.113
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No