Information card for entry 1575763

Structure parameters

• Formula: C42 H48 N4 Ni O2 Si2
• Calculated formula: C42 H48 N4 Ni O2 Si2
• Title of publication: N-Heterocyclic silylene complexes of nickel(0).
• Authors of publication: Glok, Eduard; Werner, Luis; Radius, Udo
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2025
• Journal volume: 54
• Journal issue: 39
• Pages of publication: 14846 - 14861
• a: 12.7926 ± 0.0001 Å
• b: 16.3317 ± 0.0002 Å
• c: 19.1874 ± 0.0002 Å
• α: 90°
• β: 91.412 ± 0.001°
• γ: 90°
• Cell volume: 4007.51 ± 0.07 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.05
• Residual factor for significantly intense reflections: 0.0396
• Weighted residual factors for significantly intense reflections: 0.1025
• Weighted residual factors for all reflections included in the refinement: 0.1074
• Goodness-of-fit parameter for all reflections included in the refinement: 1.069
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No