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Information card for entry 1576092
Preview
| Coordinates | 1576092.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C205 H242 Cl3 Cu15 O35 |
|---|---|
| Calculated formula | C205 H242 Cl3 Cu15 O35 |
| Title of publication | α-Hydroxyalkynyl-protected copper(I) acetelyenediide nanoclusters with anion-dependent photoluminescence. |
| Authors of publication | Yao, Jun-Fei; Zhao, Pei; Hu, Feng; Yang, Ya-Nan; Nan, Zi-Ang; Huang, Qiu-Qin; Li, Jing-Yu; Chen, Jian; Lei, Zhen; Wei, Qiao-Hua; Ehara, Masahiro; Wang, Quan-Ming |
| Journal of publication | Nanoscale |
| Year of publication | 2025 |
| Journal volume | 17 |
| Journal issue | 43 |
| Pages of publication | 25289 - 25296 |
| a | 16.3979 ± 0.0003 Å |
| b | 23.0681 ± 0.0005 Å |
| c | 31.533 ± 0.0005 Å |
| α | 90° |
| β | 92.99 ± 0.002° |
| γ | 90° |
| Cell volume | 11911.7 ± 0.4 Å3 |
| Cell temperature | 200 ± 0.1 K |
| Ambient diffraction temperature | 200 ± 0.1 K |
| Number of distinct elements | 5 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.1274 |
| Residual factor for significantly intense reflections | 0.1088 |
| Weighted residual factors for significantly intense reflections | 0.2915 |
| Weighted residual factors for all reflections included in the refinement | 0.3082 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.212 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.3405 Å |
| Diffraction radiation type | GaKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1576092.html
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Users of the data should acknowledge the original authors of the
structural data.