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Information card for entry 1576128
Preview
| Coordinates | 1576128.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C207 H222 Cu20 P3 S19 |
|---|---|
| Calculated formula | C207 H222 Cu19.9999 P3 S19 |
| Title of publication | Surface defects in atom-precise copper nanoclusters and their different catalytic efficiencies. |
| Authors of publication | Ge, Xin; Chen, Ruihang; Deng, Hongwen; Fang, Lei; Pan, Kunyi; Shan, Bochen; Gu, Bangde; Sun, Xin; Zheng, Yun; Teo, Boon K.; Sun, Cunfa |
| Journal of publication | Nanoscale |
| Year of publication | 2025 |
| Journal volume | 17 |
| Journal issue | 44 |
| Pages of publication | 25490 - 25494 |
| a | 33.2347 ± 0.0003 Å |
| b | 33.2347 ± 0.0003 Å |
| c | 17.02607 ± 0.00019 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 16286.5 ± 0.3 Å3 |
| Cell temperature | 100 ± 0.1 K |
| Ambient diffraction temperature | 100 ± 0.1 K |
| Number of distinct elements | 5 |
| Space group number | 146 |
| Hermann-Mauguin space group symbol | R 3 :H |
| Hall space group symbol | R 3 |
| Residual factor for all reflections | 0.1099 |
| Residual factor for significantly intense reflections | 0.1022 |
| Weighted residual factors for significantly intense reflections | 0.2606 |
| Weighted residual factors for all reflections included in the refinement | 0.2646 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.048 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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