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Information card for entry 1577390
Preview
| Coordinates | 1577390.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Tetrakis(4-(methylthio)phenyl)silane |
|---|---|
| Formula | C28 H28 S4 Si |
| Calculated formula | C28 H28 S4 Si |
| Title of publication | Enhanced electronic coupling in tetraaryl molecular junctions with osmium(IV) centers |
| Authors of publication | Zagami, Luana; Sharma, Mukund; Fraire, Andrew; Avedian, Cynthia; Olivar, Clarissa; Czyszczon-Burton, Thomas M.; Prana, Jazmine; Yergeshbayeva, Sandugash; Camarasa-Gómez, María; Hernangómez-Pérez, Daniel; Inkpen, Michael Stephen |
| Journal of publication | Chemical Science |
| Year of publication | 2026 |
| a | 13.3502 ± 0.0002 Å |
| b | 13.3502 ± 0.0002 Å |
| c | 7.3339 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1307.11 ± 0.05 Å3 |
| Cell temperature | 100 ± 0.3 K |
| Ambient diffraction temperature | 100 ± 0.3 K |
| Number of distinct elements | 4 |
| Space group number | 82 |
| Hermann-Mauguin space group symbol | I -4 |
| Hall space group symbol | I -4 |
| Residual factor for all reflections | 0.027 |
| Residual factor for significantly intense reflections | 0.0262 |
| Weighted residual factors for significantly intense reflections | 0.0684 |
| Weighted residual factors for all reflections included in the refinement | 0.0692 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.054 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1577390.html
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