Information card for entry 2003773
| Common name |
pentachlorophenyl |
| Formula |
C15 H8 Cl5 N O |
| Calculated formula |
C15 H8 Cl5 N O |
| SMILES |
Clc1c(c(Cl)c(Cl)c(Cl)c1Cl)C(C#N)c1cc(ccc1)OC |
| Title of publication |
α-(2,3,5,6-Tetrachlorophenyl)-α-(3-thienyl)acetonitrile and α-(3-Methoxyphenyl)-α-(2,3,4,5,6-pentachlorophenyl)acetonitrile |
| Authors of publication |
Zhang, H.; Refat, H. M.; Biehl, E. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1995 |
| Journal volume |
51 |
| Journal issue |
8 |
| Pages of publication |
1667 - 1670 |
| a |
7.681 ± 0.002 Å |
| b |
8.78 ± 0.002 Å |
| c |
12.761 ± 0.003 Å |
| α |
100.24 ± 0.02° |
| β |
99.65 ± 0.02° |
| γ |
108.39 ± 0.02° |
| Cell volume |
780.2 ± 0.4 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
230 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.144 |
| Residual factor for significantly intense reflections |
0.056 |
| Weighted residual factors for all reflections |
0.105 |
| Weighted residual factors for significantly intense reflections |
0.075 |
| Goodness-of-fit parameter for all reflections |
1.016 |
| Goodness-of-fit parameter for significantly intense reflections |
1.161 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/2003773.html