Information card for entry 2003895

Structure parameters

• Chemical name: cis-Bis(0.4bromo/0.6iodo)diethyldithiocarbamato-4-methoxyphenyltellurium(IV)
• Formula: C12 H17 Br0.8 I1.2 N O S2 Te
• Calculated formula: C12 H17 Br0.8 I1.2 N O S2 Te
• Title of publication: <i>cis</i>-(Diethyldithiocarbamato)diiodo(phenyl)tellurium(IV), PhTe(S~2~CNEt~2~)I~2~, and its Methoxy-Substituted Mixed Br/I Analogue <i>cis</i>-Bis(0.4-bromo/0.6-iodo)(diethyldithiocarbamato)(4-methoxyphenyl)tellurium(IV), <i>p</i>-MeOC~6~H~4~Te(S~2~CNEt~2~)(Br~0.4~I~0.6~)~2~
• Authors of publication: Husebye, S.; Kudis, S.; Lindeman, S. V.; Strauch, P.
• Journal of publication: Acta Crystallographica Section C
• Year of publication: 1995
• Journal volume: 51
• Journal issue: 9
• Pages of publication: 1870 - 1875
• a: 9.9482 ± 0.0012 Å
• b: 10.428 ± 0.003 Å
• c: 11.004 ± 0.002 Å
• α: 66.95 ± 0.02°
• β: 65.934 ± 0.011°
• γ: 75.94 ± 0.02°
• Cell volume: 954.4 ± 0.4 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 8
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0555
• Residual factor for significantly intense reflections: 0.0427
• Weighted residual factors for all reflections: 0.1492
• Weighted residual factors for significantly intense reflections: 0.1245
• Goodness-of-fit parameter for all reflections: 1.059
• Goodness-of-fit parameter for significantly intense reflections: 1.108
• Diffraction radiation wavelength: 0.71069 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No