Information card for entry 2004181
| Chemical name |
7-Methyl-3-methylsulfanyl-4H-pyrido[4,3-e]-1,2,4-thiadiazine 1,1-Dioxide Inner Salt |
| Formula |
C8 H9 N3 O2 S2 |
| Calculated formula |
C8 H9 N3 O2 S2 |
| SMILES |
S1(=O)(=O)N=C(N=c2ccn(cc12)C)SC |
| Title of publication |
7-Methyl-3-methylthio-4<i>H</i>-pyrido[4,3-<i>e</i>]-1,2,4-thiadiazin-7-ium-4-ide 1,1-Dioxide Zwitterion |
| Authors of publication |
Dupont, L.; de Tullio, P.; Pirotte, B.; Masereel, B.; Delarge, J. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1995 |
| Journal volume |
51 |
| Journal issue |
11 |
| Pages of publication |
2416 - 2417 |
| a |
7.3767 ± 0.0007 Å |
| b |
8.1696 ± 0.0007 Å |
| c |
8.5483 ± 0.0007 Å |
| α |
82.557 ± 0.009° |
| β |
83.195 ± 0.007° |
| γ |
84.162 ± 0.005° |
| Cell volume |
505.27 ± 0.08 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0447 |
| Residual factor for significantly intense reflections |
0.042 |
| Weighted residual factors for all reflections |
0.1297 |
| Weighted residual factors for significantly intense reflections |
0.1145 |
| Goodness-of-fit parameter for all reflections |
1.051 |
| Goodness-of-fit parameter for significantly intense reflections |
1.084 |
| Diffraction radiation wavelength |
1.5418 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/2004181.html