Information card for entry 2004283
| Chemical name |
1,1,4,4-Tetraphenyl-1,3-butadiene-lithium-tris(dimethoxyethane) |
| Formula |
C40 H52 Li O6 |
| Calculated formula |
C40 H52 Li O6 |
| SMILES |
[Li]123([O](C)CC[O]1C)([O](C)CC[O]2C)[O](C)CC[O]3C.C(=CC=C(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication |
Tris(1,2-dimethoxyethane)lithium 1,1,4,4-Tetraphenyl-1,3-butadiene Radical Anion |
| Authors of publication |
Näther, C.; Bock, H.; Bolte, M. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1995 |
| Journal volume |
51 |
| Journal issue |
12 |
| Pages of publication |
2510 - 2514 |
| a |
12.16 ± 0.005 Å |
| b |
12.482 ± 0.005 Å |
| c |
14.755 ± 0.005 Å |
| α |
68.172 ± 0.005° |
| β |
80.307 ± 0.005° |
| γ |
61.792 ± 0.005° |
| Cell volume |
1832 ± 1.2 Å3 |
| Cell temperature |
100 K |
| Ambient diffraction temperature |
100 K |
| Number of distinct elements |
4 |
| Space group number |
1 |
| Hermann-Mauguin space group symbol |
P 1 |
| Hall space group symbol |
P 1 |
| Residual factor for all reflections |
0.0623 |
| Residual factor for significantly intense reflections |
0.0433 |
| Weighted residual factors for all reflections |
0.1289 |
| Weighted residual factors for significantly intense reflections |
0.1198 |
| Goodness-of-fit parameter for all reflections |
1.043 |
| Goodness-of-fit parameter for significantly intense reflections |
1.088 |
| Diffraction radiation wavelength |
0.7106 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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The link is:
https://www.crystallography.net/2004283.html