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Information card for entry 2005650
Preview
| Coordinates | 2005650.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | [N,N'-bis(2-thiobenzenylidene)1,2-dimethyl-4,5-phenylenediaminato]nickel(II) |
|---|---|
| Formula | C22 H18 N2 Ni S2 |
| Calculated formula | C22 H18 N2 Ni S2 |
| Title of publication | [<i>N</i>,<i>N</i>'-Bis(2-thiobenzylidene)-1,2-dimethyl-4,5-phenylenediaminato]nickel(II), Ni(tsaldimph) |
| Authors of publication | Henderson, R. K.; Bouwman, E.; Reedijk, J.; Powell, A. K. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1996 |
| Journal volume | 52 |
| Journal issue | 11 |
| Pages of publication | 2696 - 2698 |
| a | 12.578 ± 0.002 Å |
| b | 12.848 ± 0.002 Å |
| c | 11.505 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1859.2 ± 0.5 Å3 |
| Cell temperature | 291 K |
| Ambient diffraction temperature | 291 K |
| Number of distinct elements | 5 |
| Space group number | 60 |
| Hermann-Mauguin space group symbol | P b c n |
| Hall space group symbol | -P 2n 2ab |
| Residual factor for all reflections | 0.0584 |
| Residual factor for significantly intense reflections | 0.0328 |
| Weighted residual factors for all reflections | 0.0498 |
| Weighted residual factors for significantly intense reflections | 0.0454 |
| Goodness-of-fit parameter for significantly intense reflections | 1.08 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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