Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 2005963
Preview
| Coordinates | 2005963.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | Trans-Diiodobis(triphenylarsine)platinum(II): Correlation of structural cis effect |
|---|---|
| Formula | C36 H30 As2 I2 Pt |
| Calculated formula | C36 H30 As2 I2 Pt |
| SMILES | I[Pt]([As](c1ccccc1)(c1ccccc1)c1ccccc1)(I)[As](c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication | <i>trans</i>-Diiodobis(triphenylarsine-<i>As</i>)platinum(II) |
| Authors of publication | Otto, S.; Roodt, A. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1997 |
| Journal volume | 53 |
| Journal issue | 3 |
| Pages of publication | 280 - 282 |
| a | 10.433 ± 0.004 Å |
| b | 12.538 ± 0.005 Å |
| c | 13.27 ± 0.005 Å |
| α | 84.71 ± 0.03° |
| β | 77.78 ± 0.03° |
| γ | 78.42 ± 0.03° |
| Cell volume | 1659.7 ± 1.1 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0397 |
| Residual factor for significantly intense reflections | 0.0397 |
| Weighted residual factors for all reflections | 0.1143 |
| Weighted residual factors for significantly intense reflections | 0.1143 |
| Goodness-of-fit parameter for all reflections | 1.085 |
| Goodness-of-fit parameter for significantly intense reflections | 1.085 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2005963.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.