Information card for entry 2006306
| Chemical name |
3,4-Diido-2,5-dimethylhexa-2,4-diene |
| Formula |
C8 H12 I2 |
| Calculated formula |
C8 H12 I2 |
| SMILES |
IC(=C(C)C)C(=C(C)C)I |
| Title of publication |
3,4-Diiodo-2,5-dimethylhexa-2,4-diene |
| Authors of publication |
Jones, Peter G.; Bubenitschek, Peter; Höpfner, Thomas; Hopf, Henning |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1997 |
| Journal volume |
53 |
| Journal issue |
7 |
| Pages of publication |
918 - 920 |
| a |
12.614 ± 0.004 Å |
| b |
6.607 ± 0.002 Å |
| c |
12.921 ± 0.004 Å |
| α |
90° |
| β |
94.59 ± 0.03° |
| γ |
90° |
| Cell volume |
1073.4 ± 0.6 Å3 |
| Cell temperature |
143 ± 2 K |
| Ambient diffraction temperature |
143 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
15 |
| Hermann-Mauguin space group symbol |
C 1 2/c 1 |
| Hall space group symbol |
-C 2yc |
| Residual factor for all reflections |
0.0228 |
| Residual factor for significantly intense reflections |
0.0215 |
| Weighted residual factors for all reflections |
0.0552 |
| Weighted residual factors for significantly intense reflections |
0.054 |
| Goodness-of-fit parameter for all reflections |
1.109 |
| Goodness-of-fit parameter for significantly intense reflections |
1.109 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/2006306.html