Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 2006408
Preview
| Coordinates | 2006408.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | Bis[aqua(chlorodifluoroacetato)triphenyltin-1,10-phenanthroline] |
|---|---|
| Formula | C32 H25 Cl F2 N2 O3 Sn |
| Calculated formula | C32 H25 Cl F2 N2 O3 Sn |
| SMILES | c1(ccccc1)[Sn](OC(=O)C(F)(F)Cl)([OH2])(c1ccccc1)c1ccccc1.n1c2c(ccc1)ccc1cccnc21 |
| Title of publication | Bis[aqua(chlorodifluoroacetato-<i>O</i>)triphenyltin‒1,10-phenanthroline] |
| Authors of publication | Ng, Seik Weng |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1997 |
| Journal volume | 53 |
| Journal issue | 8 |
| Pages of publication | 1059 - 1061 |
| a | 9.515 ± 0.001 Å |
| b | 12.234 ± 0.001 Å |
| c | 12.787 ± 0.001 Å |
| α | 89.888 ± 0.008° |
| β | 97.377 ± 0.009° |
| γ | 90.29 ± 0.009° |
| Cell volume | 1476.1 ± 0.2 Å3 |
| Cell temperature | 298 ± 2 K |
| Ambient diffraction temperature | 298 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.063 |
| Residual factor for significantly intense reflections | 0.0557 |
| Weighted residual factors for all reflections | 0.1447 |
| Weighted residual factors for significantly intense reflections | 0.1397 |
| Goodness-of-fit parameter for all reflections | 1.087 |
| Goodness-of-fit parameter for significantly intense reflections | 1.14 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2006408.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.