Information card for entry 2006668
| Chemical name |
perilo(1,12-b,c,d)thiophene |
| Formula |
C20 H10 S |
| Calculated formula |
C20 H10 S |
| SMILES |
s1c2c3c4c(cc2)cccc4c2cccc4ccc1c3c24 |
| Title of publication |
Perylo[1,12-<i>b</i>,<i>c</i>,<i>d</i>]thiophene |
| Authors of publication |
Santos, Isabel C.; Almeida, Manuel; Morgado, Jorge; Duarte, M. Teresa; Alcácer, Luís |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1997 |
| Journal volume |
53 |
| Journal issue |
11 |
| Pages of publication |
1640 - 1642 |
| a |
16.921 ± 0.002 Å |
| b |
4.5252 ± 0.0004 Å |
| c |
17.898 ± 0.002 Å |
| α |
90° |
| β |
112.655 ± 0.011° |
| γ |
90° |
| Cell volume |
1264.7 ± 0.3 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/a 1 |
| Hall space group symbol |
-P 2yab |
| Residual factor for all reflections |
0.0873 |
| Residual factor for significantly intense reflections |
0.04 |
| Weighted residual factors for all reflections |
0.124 |
| Weighted residual factors for significantly intense reflections |
0.0901 |
| Goodness-of-fit parameter for all reflections |
1.129 |
| Goodness-of-fit parameter for significantly intense reflections |
1.037 |
| Diffraction radiation wavelength |
0.71069 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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