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Information card for entry 2006788
Preview
| Coordinates | 2006788.cif |
|---|---|
| Original IUCr paper | HTML |
| Formula | C15 H19 F3 N O3 P |
|---|---|
| Calculated formula | C15 H19 F6 N O3 P |
| Title of publication | A π-Stacked Complex Between 4,4'-Dimethyl-4,4'-bipyridinium Bis(hexafluorophosphate) and 1,5-Bis[(hydroxyethoxy)ethoxy]naphthalene |
| Authors of publication | Benniston, Andrew C.; Yufit, Dmitrii S.; Mackie, Philip R. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1997 |
| Journal volume | 53 |
| Journal issue | 12 |
| Pages of publication | 1899 - 1901 |
| a | 15.005 ± 0.005 Å |
| b | 6.829 ± 0.005 Å |
| c | 17.749 ± 0.005 Å |
| α | 90 ± 0.005° |
| β | 102.25 ± 0.005° |
| γ | 90 ± 0.005° |
| Cell volume | 1777.3 ± 1.5 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.19 |
| Residual factor for significantly intense reflections | 0.0761 |
| Weighted residual factors for all reflections | 0.2796 |
| Weighted residual factors for significantly intense reflections | 0.2026 |
| Goodness-of-fit parameter for all reflections | 1.032 |
| Goodness-of-fit parameter for significantly intense reflections | 1.178 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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structural data.