Information card for entry 2006848
| Chemical name |
Ethylammonium Di(benzenesulfonyl)amide: 1,4,7,10,13,16-Hexaoxacyclooctadecane (1:1) |
| Formula |
C26 H42 N2 O10 S2 |
| Calculated formula |
C26 H42 N2 O10 S2 |
| SMILES |
C1COCCOCCOCCOCCOCCO1.[NH3+]CC.[N-](S(=O)(=O)c1ccccc1)S(=O)(=O)c1ccccc1 |
| Title of publication |
Polysulfonylamines. XCI. Ethylammonium Di(benzenesulfonyl)amide 1,4,7,10,13,16-Hexaoxacyclooctadecane (1/1/1) |
| Authors of publication |
Henschel, Dagmar; Blaschette, Armand; Jones, Peter G. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1997 |
| Journal volume |
53 |
| Journal issue |
12 |
| Pages of publication |
1875 - 1877 |
| a |
13.237 ± 0.003 Å |
| b |
8.309 ± 0.002 Å |
| c |
13.954 ± 0.004 Å |
| α |
90° |
| β |
104.17 ± 0.03° |
| γ |
90° |
| Cell volume |
1488.1 ± 0.7 Å3 |
| Cell temperature |
143 ± 2 K |
| Ambient diffraction temperature |
143 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
4 |
| Hermann-Mauguin space group symbol |
P 1 21 1 |
| Hall space group symbol |
P 2yb |
| Residual factor for all reflections |
0.0341 |
| Residual factor for significantly intense reflections |
0.0311 |
| Weighted residual factors for all reflections |
0.0796 |
| Weighted residual factors for significantly intense reflections |
0.0756 |
| Goodness-of-fit parameter for all reflections |
1.042 |
| Goodness-of-fit parameter for significantly intense reflections |
1.034 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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