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Information card for entry 2007041
Preview
| Coordinates | 2007041.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | tetraphenylphosphonium aquotetraiodooxomolybdate(V) |
|---|---|
| Formula | C24 H22 I4 Mo O2 P |
| Calculated formula | C24 H20 I4 Mo O2 P |
| Title of publication | Two Tetrahalooxomolybdate(V) Structures, [Ph~3~PNPPh~3~][MoOBr~4~] and [PPh~4~][MoOI~4~(H~2~ O)] |
| Authors of publication | Fettinger, James C.; Mattamana, Sundeep P.; Poli, Rinaldo |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1998 |
| Journal volume | 54 |
| Journal issue | 2 |
| Pages of publication | 184 - 187 |
| a | 13.258 ± 0.002 Å |
| b | 13.258 ± 0.002 Å |
| c | 7.8926 ± 0.0015 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1387.3 ± 0.4 Å3 |
| Cell temperature | 153 ± 2 K |
| Ambient diffraction temperature | 153 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 85 |
| Hermann-Mauguin space group symbol | P 4/n :2 |
| Hall space group symbol | -P 4a |
| Residual factor for all reflections | 0.0678 |
| Residual factor for significantly intense reflections | 0.0551 |
| Weighted residual factors for all reflections | 0.1266 |
| Weighted residual factors for significantly intense reflections | 0.1212 |
| Goodness-of-fit parameter for all reflections | 1.195 |
| Goodness-of-fit parameter for significantly intense reflections | 1.254 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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