Information card for entry 2007128
| Chemical name |
((1R,2S,4R,5S)-exo-2-acetoxy-3,3-dimethylbicyclo[3.1.0]hexan-exo-4-yl) camphanoate |
| Formula |
C20 H28 O6 |
| Calculated formula |
C20 H28 O6 |
| SMILES |
O([C@H]1[C@H]2[C@@H]([C@@H](OC(=O)[C@]34OC(=O)[C@@](CC3)(C)C4(C)C)C1(C)C)C2)C(=O)C |
| Title of publication |
Synthesis and Absolute Structure Determination of Camphanoate Derivatives of Five Bicyclo[3.1.0]hexane Compounds |
| Authors of publication |
Krief, Alain; Ollevier, Thierry; Swinnen, Dominique; Norberg, Bernadette; Baudoux, Guy; Evrard, Guy |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1998 |
| Journal volume |
54 |
| Journal issue |
3 |
| Pages of publication |
392 - 398 |
| a |
11.5461 ± 0.0011 Å |
| b |
12.2484 ± 0.0007 Å |
| c |
7.169 ± 0.005 Å |
| α |
90° |
| β |
102.487 ± 0.004° |
| γ |
90° |
| Cell volume |
989.9 ± 0.7 Å3 |
| Cell temperature |
292 ± 2 K |
| Ambient diffraction temperature |
292 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
4 |
| Hermann-Mauguin space group symbol |
P 1 21 1 |
| Hall space group symbol |
P 2yb |
| Residual factor for all reflections |
0.0438 |
| Residual factor for significantly intense reflections |
0.043 |
| Weighted residual factors for all reflections included in the refinement |
0.1088 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.084 |
| Diffraction radiation wavelength |
1.54178 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/2007128.html