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Information card for entry 2007146
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| Coordinates | 2007146.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | bis(iodo)tetrakis{tris(dimethylamido)phosphineoxide}bismuth(III) pentaiodide |
|---|---|
| Formula | C24 H72 Bi I7 N12 O4 P4 |
| Calculated formula | C24 H72 Bi I7 N12 O4 P4 |
| Title of publication | Diiodotetrakis[tris(dimethylamino)phosphine oxide-<i>O</i>]bismuth(III) Pentaiodide, [BiI~2~{OP(NMe~2~)~3~}~4~][I~5~] |
| Authors of publication | Louis J. Farrugia; Nicholas C. Norman; Nigel L. Pickett |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1998 |
| Journal volume | 54 |
| Journal issue | 4 |
| Pages of publication | 476 - 479 |
| a | 13.775 ± 0.006 Å |
| b | 13.775 ± 0.006 Å |
| c | 30.533 ± 0.005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 5794 ± 4 Å3 |
| Cell temperature | 291 ± 2 K |
| Ambient diffraction temperature | 291 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 122 |
| Hermann-Mauguin space group symbol | I -4 2 d |
| Hall space group symbol | I -4 2bw |
| Residual factor for all reflections | 0.0658 |
| Residual factor for significantly intense reflections | 0.0305 |
| Weighted residual factors for all reflections | 0.0765 |
| Weighted residual factors for significantly intense reflections | 0.0659 |
| Goodness-of-fit parameter for all reflections | 1.001 |
| Goodness-of-fit parameter for significantly intense reflections | 1.081 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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