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Information card for entry 2007159
Preview
| Coordinates | 2007159.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | Bis(1,10-Phenantholine)-copper(ii) tetrathionate |
|---|---|
| Formula | C24 H16 Cu N4 O6 S4 |
| Calculated formula | C24 H16 Cu N4 O6 S4 |
| Title of publication | Bis(1,10-phenanthroline-<i>N</i>,<i>N</i>')copper(II) Tetrathionate and Tris(1,10-phenanthroline-<i>N</i>,<i>N</i>')copper(II) Tetrathionate Pentahydrate |
| Authors of publication | Freire, Eleonora; Baggio, Sergio; Baggio, Ricardo; Garland, Maria Teresa |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1998 |
| Journal volume | 54 |
| Journal issue | 4 |
| Pages of publication | 464 - 468 |
| a | 11.253 ± 0.001 Å |
| b | 13.033 ± 0.001 Å |
| c | 17.563 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2575.8 ± 0.4 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 60 |
| Hermann-Mauguin space group symbol | P b c n |
| Hall space group symbol | -P 2n 2ab |
| Residual factor for all reflections | 0.1011 |
| Residual factor for significantly intense reflections | 0.0556 |
| Weighted residual factors for all reflections | 0.1803 |
| Weighted residual factors for significantly intense reflections | 0.1422 |
| Goodness-of-fit parameter for all reflections | 0.951 |
| Goodness-of-fit parameter for significantly intense reflections | 1.001 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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