Information card for entry 2007409
| Formula |
C30 H22 N2 O2 |
| Calculated formula |
C30 H22 N2 O2 |
| SMILES |
O1C(=O)[C@@]2(N(N=C([C@H]2c2ccccc2)c2ccccc2)c2ccccc2)C=C1c1ccccc1.O1C(=O)[C@]2(N(N=C([C@@H]2c2ccccc2)c2ccccc2)c2ccccc2)C=C1c1ccccc1 |
| Title of publication |
1,3,4,8-Tetraphenyl-7-oxa-1,2-diazaspiro[4.4]nona-2,8-dien-6-one |
| Authors of publication |
Puviarasan, K.; Govindasamy, L.; Velmurugan, D.; Shanmuga Sundara Raj, S.; Hoong-Kun Fun; Shanmuga Sundaram, M.; Raghunathan, R. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1998 |
| Journal volume |
54 |
| Journal issue |
7 |
| Pages of publication |
959 - 961 |
| a |
9.554 ± 0.001 Å |
| b |
10.401 ± 0.001 Å |
| c |
12.999 ± 0.001 Å |
| α |
71.92 ± 0.01° |
| β |
70.72 ± 0.01° |
| γ |
74.95 ± 0.01° |
| Cell volume |
1141.2 ± 0.2 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0812 |
| Residual factor for significantly intense reflections |
0.0407 |
| Weighted residual factors for all reflections included in the refinement |
0.1141 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.783 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/2007409.html