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Information card for entry 2007453
Preview
| Coordinates | 2007453.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | bis(p-methoxyphenyl)tellurium(IV) diiodide |
|---|---|
| Formula | C14 H14 I2 O2 Te |
| Calculated formula | C14.5 H12.5 I2 O2.5 Te |
| Title of publication | Two Polymorphs of Bis(4-methoxyphenyl)tellurium(IV) Diiodide |
| Authors of publication | Joan Farran; Angel Alvarez-Larena; Mario V. Capparelli; Joan F. Piniella; Gabriel Germain; Libardo Torres-Castellanos |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1998 |
| Journal volume | 54 |
| Journal issue | 7 |
| Pages of publication | 995 - 1000 |
| a | 11.822 ± 0.004 Å |
| b | 14.812 ± 0.005 Å |
| c | 22.612 ± 0.003 Å |
| α | 73.57 ± 0.02° |
| β | 75.4 ± 0.02° |
| γ | 67.38 ± 0.03° |
| Cell volume | 3459.5 ± 1.9 Å3 |
| Cell temperature | 295 ± 2 K |
| Ambient diffraction temperature | 295 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.049 |
| Residual factor for significantly intense reflections | 0.0365 |
| Weighted residual factors for all reflections | 0.0942 |
| Weighted residual factors for significantly intense reflections | 0.0919 |
| Goodness-of-fit parameter for all reflections | 1.066 |
| Goodness-of-fit parameter for significantly intense reflections | 1.172 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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