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Information card for entry 2007706
Preview
| Coordinates | 2007706.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | 3,3'-[Ethanediylbis(aminomethylene)]bis(pentane-2,4-dione) |
|---|---|
| Formula | C14 H20 N2 O4 |
| Calculated formula | C14 H20 N2 O4 |
| SMILES | CC(=O)C(=CNCCNC=C(C(=O)C)C(=O)C)C(=O)C |
| Title of publication | 3,3'-[Ethane-1,2-diylbis(aminomethylene)]bis(pentane-2,4-dione) and the Nickel(II) Complex of a Condensation Product |
| Authors of publication | König, Burkhard; Pelka, Mario; Dix, Ina; Jones, Peter G. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1998 |
| Journal volume | 54 |
| Journal issue | 10 |
| Pages of publication | 1468 - 1471 |
| a | 13.756 ± 0.002 Å |
| b | 8.9663 ± 0.0014 Å |
| c | 11.6831 ± 0.0018 Å |
| α | 90° |
| β | 99.828 ± 0.01° |
| γ | 90° |
| Cell volume | 1419.9 ± 0.4 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.066 |
| Residual factor for significantly intense reflections | 0.04 |
| Weighted residual factors for all reflections | 0.093 |
| Weighted residual factors for significantly intense reflections | 0.087 |
| Goodness-of-fit parameter for all reflections | 0.909 |
| Goodness-of-fit parameter for significantly intense reflections | 1.047 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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