Information card for entry 2007762
| Chemical name |
2-phenyl-cis-4,6-dimethyl-1,3-diselenane |
| Formula |
C12 H16 Se2 |
| Calculated formula |
C12 H16 Se2 |
| SMILES |
[Se]1C([Se][C@@H](C[C@@H]1C)C)c1ccccc1 |
| Title of publication |
<i>cis</i>-4,6-Dimethyl-2-phenyl-1,3-diselenane |
| Authors of publication |
Baudoux, Guy; Norberg, Bernadette; Wouters, Johan; Defrère, Laurent; Krief, Alain; Evrard, Guy |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1998 |
| Journal volume |
54 |
| Journal issue |
10 |
| Pages of publication |
1505 - 1507 |
| a |
8.582 ± 0.005 Å |
| b |
9.609 ± 0.005 Å |
| c |
31.213 ± 0.005 Å |
| α |
90 ± 0.005° |
| β |
90 ± 0.005° |
| γ |
90 ± 0.005° |
| Cell volume |
2574 ± 2 Å3 |
| Cell temperature |
292 ± 2 K |
| Ambient diffraction temperature |
292 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
61 |
| Hermann-Mauguin space group symbol |
P b c a |
| Hall space group symbol |
-P 2ac 2ab |
| Residual factor for all reflections |
0.0415 |
| Residual factor for significantly intense reflections |
0.0371 |
| Weighted residual factors for all reflections included in the refinement |
0.1025 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.077 |
| Diffraction radiation wavelength |
1.54178 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/2007762.html