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Information card for entry 2008168
Preview
| Coordinates | 2008168.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | Tris(tetraethylammonium)tetrakis(thiophenolato-μ~3~- selenido-iron) |
|---|---|
| Formula | C48 H80 Fe4 N3 S4 Se4 |
| Calculated formula | C48 H80 Fe4 N3 S4 Se4 |
| SMILES | c1(ccccc1)S[Fe]12345[Se]6[Fe]7892(Sc2ccccc2)[Fe]2%101(Sc1ccccc1)([Fe]367(Sc1ccccc1)([Se]52)[Se]9%10)[Se]48.[N+](CC)(CC)(CC)CC.[N+](CC)(CC)(CC)CC.[N+](CC)(CC)(CC)CC |
| Title of publication | Tris(tetraethylammonium) tetra-μ~3~-selenido-tetrakis[(thiophenolato-<i>S</i>)iron] |
| Authors of publication | Hauptmann, Ralf; Schneider, Jörg; Chen, Changneng; Henkel, Gerald |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1999 |
| Journal volume | 55 |
| Journal issue | 2 |
| Pages of publication | 192 - 194 |
| a | 24.49 ± 0.005 Å |
| b | 39.314 ± 0.008 Å |
| c | 11.808 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 11369 ± 4 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 6 |
| Space group number | 43 |
| Hermann-Mauguin space group symbol | F d d 2 |
| Hall space group symbol | F 2 -2d |
| Residual factor for significantly intense reflections | 0.0366 |
| Weighted residual factors for all reflections included in the refinement | 0.0824 |
| Goodness-of-fit parameter for significantly intense reflections | 1.08 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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