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Information card for entry 2008246
Preview
| Coordinates | 2008246.cif |
|---|---|
| Original IUCr paper | HTML |
| Formula | C14 H16 Cl2 N2 Ni S2 |
|---|---|
| Calculated formula | C14 H16 Cl2 N2 Ni S2 |
| SMILES | C1[S]2Cc3cccc[n]3[Ni]32(Cl)([n]2c(C[S]3C1)cccc2)Cl |
| Title of publication | Dichloro[2,2'-(2,5-dithiahexamethylene)dipyridine-<i>N</i>,<i>N</i>',<i>S</i>,<i>S</i>']nickel(II) |
| Authors of publication | Thangarasu Pandiyan; Bernès, Sylvain; Durán de Bazúa, Carmen |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1999 |
| Journal volume | 55 |
| Journal issue | 3 |
| Pages of publication | 318 - 320 |
| a | 14.5297 ± 0.0016 Å |
| b | 8.2314 ± 0.0014 Å |
| c | 14.3684 ± 0.0018 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1718.5 ± 0.4 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 60 |
| Hermann-Mauguin space group symbol | P b c n |
| Hall space group symbol | -P 2n 2ab |
| Residual factor for all reflections | 0.0445 |
| Residual factor for significantly intense reflections | 0.03 |
| Weighted residual factors for significantly intense reflections | 0.0641 |
| Weighted residual factors for all reflections included in the refinement | 0.0694 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.013 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/2008246.html
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