Information card for entry 2008381
| Common name |
fluoropyridyl-biphenyl |
| Chemical name |
1-perfluoropyridyl-4-phenylbenzene |
| Formula |
C17 H9 F4 N |
| Calculated formula |
C17 H9 F4 N |
| SMILES |
Fc1c(c(F)c(F)nc1F)c1ccc(cc1)c1ccccc1 |
| Title of publication |
4-(4-Biphenyl)-2,3,5,6-tetrafluoropyridine, a new material for application in light-emitting diodes |
| Authors of publication |
Resel, Roland; Thurner, Philipp; Kahlert, Hartmut; Völlenkle, Horst; Winkler, Berthold; Müllner, Ruth; Stelzer, Franz; Tunega, Daniel; Leising, Günther |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1999 |
| Journal volume |
55 |
| Journal issue |
4 |
| Pages of publication |
693 - 695 |
| a |
6.1418 ± 0.0002 Å |
| b |
7.5325 ± 0.0001 Å |
| c |
14.5931 ± 0.0005 Å |
| α |
91.876 ± 0.002° |
| β |
101.71 ± 0.001° |
| γ |
95.106 ± 0.002° |
| Cell volume |
657.55 ± 0.03 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.065 |
| Residual factor for significantly intense reflections |
0.046 |
| Weighted residual factors for all reflections |
0.167 |
| Weighted residual factors for significantly intense reflections |
0.135 |
| Goodness-of-fit parameter for all reflections |
1.189 |
| Goodness-of-fit parameter for significantly intense reflections |
1.116 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/2008381.html