Information card for entry 2008771
| Common name |
dimer of 2-methylene-3,4-dihydo-1(2H)-naphthalenone |
| Chemical name |
3,4-dihydronaphthyl[2,3-b]tetrahydropyran- 2-spiro-2'-3,4-dihydro-1(2H)-naphthalenone |
| Formula |
C22 H20 O2 |
| Calculated formula |
C22 H20 O2 |
| SMILES |
O1C2=C(CCC31C(=O)c1ccccc1CC3)CCc1ccccc21 |
| Title of publication |
3,4,5,6-Tetrahydro-2<i>H</i>-naphtho[1,2-<i>b</i>]pyran-2-spiro-2'-1',2',3',4'-tetrahydronaphthalene-1'-one |
| Authors of publication |
Quail, J. Wilson; Pandeya, Surendra N.; Dimmock, Jonathan R. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1999 |
| Journal volume |
55 |
| Journal issue |
8 |
| Pages of publication |
1349 - 1351 |
| a |
8.0204 ± 0.0005 Å |
| b |
9.0398 ± 0.001 Å |
| c |
22.5974 ± 0.0015 Å |
| α |
90° |
| β |
96.362 ± 0.006° |
| γ |
90° |
| Cell volume |
1628.3 ± 0.2 Å3 |
| Cell temperature |
123 ± 2 K |
| Ambient diffraction temperature |
123 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.047 |
| Residual factor for significantly intense reflections |
0.038 |
| Weighted residual factors for all reflections included in the refinement |
0.199 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.047 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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The link is:
https://www.crystallography.net/2008771.html