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Information card for entry 2008801
Preview
| Coordinates | 2008801.cif |
|---|---|
| Original IUCr paper | HTML |
| Formula | C42 H34 P2 Pt S2 |
|---|---|
| Calculated formula | C42 H34 P2 Pt S2 |
| SMILES | [Pt]1(Sc2c(S1)cccc2)([P](c1ccccc1)(c1ccccc1)c1ccccc1)[P](c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication | Three Pt^II^ catecholate and 1,2-dithiocatecholate complexes |
| Authors of publication | Lesley, M.J. Gerald; Clegg, William; Marder, Todd B.; Norman, Nicholas C.; Orpen, A. Guy; Scott, Andrew J.; Starbuck, Jonathan |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1999 |
| Journal volume | 55 |
| Journal issue | 8 |
| Pages of publication | 1272 - 1275 |
| a | 9.0177 ± 0.0007 Å |
| b | 10.9977 ± 0.0008 Å |
| c | 17.9351 ± 0.0012 Å |
| α | 90° |
| β | 102.093 ± 0.002° |
| γ | 90° |
| Cell volume | 1739.2 ± 0.2 Å3 |
| Cell temperature | 160 ± 2 K |
| Ambient diffraction temperature | 160 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 7 |
| Hermann-Mauguin space group symbol | P 1 n 1 |
| Hall space group symbol | P -2yac |
| Residual factor for all reflections | 0.0192 |
| Residual factor for significantly intense reflections | 0.0184 |
| Weighted residual factors for all reflections | 0.0465 |
| Weighted residual factors for significantly intense reflections | 0.0456 |
| Goodness-of-fit parameter for all reflections | 1.124 |
| Goodness-of-fit parameter for significantly intense reflections | 1.113 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/2008801.html
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Users of the data should acknowledge the original authors of the
structural data.