Information card for entry 2008837
| Chemical name |
d,l-2,4-bis(phenylthio)-3-pentanone |
| Formula |
C17 H18 O S2 |
| Calculated formula |
C17 H18 O S2 |
| SMILES |
C[C@H](C(=O)[C@H](Sc1ccccc1)C)Sc1ccccc1.C[C@@H](C(=O)[C@@H](Sc1ccccc1)C)Sc1ccccc1 |
| Title of publication |
<i>dl</i>-2,4-Bis(phenylthio)pentan-3-one and <i>dl</i>-2,4-bis(2,6-dimethylphenylthio)pentan-3-one at 173K |
| Authors of publication |
Crundwell, Guy; Kessler, Jacqueline; Kaller, Matt; McCoy, Mike; Bayne, Christopher; Hardinger, Steven A.; Kantardjieff, Katherine |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1999 |
| Journal volume |
55 |
| Journal issue |
8 |
| Pages of publication |
IUC9900088 |
| a |
19.1266 ± 0.0019 Å |
| b |
8.2451 ± 0.0008 Å |
| c |
10.0462 ± 0.001 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
1584.3 ± 0.3 Å3 |
| Cell temperature |
173 ± 2 K |
| Ambient diffraction temperature |
173 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
45 |
| Hermann-Mauguin space group symbol |
I b a 2 |
| Hall space group symbol |
I 2 -2c |
| Residual factor for all reflections |
0.097 |
| Residual factor for significantly intense reflections |
0.058 |
| Weighted residual factors for all reflections included in the refinement |
0.136 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.948 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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