Information card for entry 2008918
| Formula |
C30 H60 La N7 O15 |
| Calculated formula |
C30 H60 La N7 O15 |
| SMILES |
[La]12345([O]=C(N(CC)CC)C(C(=[O]1)N(CC)CC)CCOCC)([O]=C(N(CC)CC)C(C(N(CC)CC)=[O]2)CCOCC)(ON(=[O]3)=O)(ON(=[O]4)=O)ON(=[O]5)=O |
| Title of publication |
Bis[2-(2-ethoxyethyl)-<i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-tetraethylmalondiamide-<i>O</i>^1^,<i>O</i>^3^]tris(nitrato-<i>O</i>,<i>O</i>')lanthanum(III) |
| Authors of publication |
Thuéry, Pierre; Nierlich, Martine; Charbonnel, Marie-Christine; Dognon, Jean-Pierre |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
1999 |
| Journal volume |
55 |
| Journal issue |
9 |
| Pages of publication |
1434 - 1436 |
| a |
11.2868 ± 0.0006 Å |
| b |
30.877 ± 0.002 Å |
| c |
11.9177 ± 0.0006 Å |
| α |
90° |
| β |
92.746 ± 0.003° |
| γ |
90° |
| Cell volume |
4148.6 ± 0.4 Å3 |
| Cell temperature |
123 ± 2 K |
| Ambient diffraction temperature |
123 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.052 |
| Residual factor for significantly intense reflections |
0.035 |
| Weighted residual factors for all reflections |
0.12 |
| Weighted residual factors for all reflections included in the refinement |
0.076 |
| Goodness-of-fit parameter for all reflections |
1.131 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.06 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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