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Information card for entry 2009356
Preview
| Coordinates | 2009356.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | cis-dichloro(1,10-phenanthroline)tiourea-acuo-cobalt(II):tiourea |
|---|---|
| Formula | C14 H18 Cl2 Co N6 O S2 |
| Calculated formula | C14 H18 Cl2 Co N6 O S2 |
| SMILES | [Co]1([n]2cccc3ccc4ccc[n]1c4c23)([OH2])([S]=C(N)N)(Cl)Cl.S=C(N)N |
| Title of publication | [Co(phen)(thiourea)(H~2~ O)Cl~2~]^.^thiourea (phen is 1,10-phenanthroline) |
| Authors of publication | Suescun, Leopoldo; Mariezcurrena, Raúl A.; Mombrú, Alvaro W. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1999 |
| Journal volume | 55 |
| Journal issue | 12 |
| Pages of publication | 2065 - 2068 |
| a | 9.719 ± 0.003 Å |
| b | 11.682 ± 0.003 Å |
| c | 8.7504 ± 0.0013 Å |
| α | 92.932 ± 0.014° |
| β | 90.434 ± 0.017° |
| γ | 85.99 ± 0.02° |
| Cell volume | 989.8 ± 0.4 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0642 |
| Residual factor for significantly intense reflections | 0.0409 |
| Weighted residual factors for all reflections included in the refinement | 0.1223 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.024 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2009356.html
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