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Information card for entry 2009910
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| Coordinates | 2009910.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | diphenyltindithiophenol |
|---|---|
| Formula | C24 H20 S2 Sn |
| Calculated formula | C24 H20 S2 Sn |
| Title of publication | (Benzenethiolato-κ<i>S</i>)triphenyltin(IV), [Sn(C~6~H~5~S)(C~6~H~5~)~3~] (I), and bis(benzenethiolato-κ<i>S</i>)diphenyltin(IV), [Sn(C~6~H~5~S)~2~(C~6~H~5~)~2~] (II) |
| Authors of publication | Speziali, Nivaldo L.; Guimarães, Beatriz G.; Silva, Rosalice M.; Duarte, Paulo H.; Aguiar, Silvestre R. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1994 |
| Journal volume | 50 |
| Journal issue | 7 |
| Pages of publication | 1059 - 1062 |
| a | 9.449 ± 0.002 Å |
| b | 10.31 ± 0.002 Å |
| c | 12.43 ± 0.002 Å |
| α | 95.39 ± 0.001° |
| β | 103.19 ± 0.001° |
| γ | 107.44 ± 0.001° |
| Cell volume | 1107.5 ± 0.4 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for significantly intense reflections | 0.03 |
| Weighted residual factors for significantly intense reflections | 0.043 |
| Goodness-of-fit parameter for significantly intense reflections | 0.82 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2009910.html
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