Information card for entry 2010539
| Common name |
2,2'-bis(4,4-diphenyl-2,5-cyclohexadienone)diselenide |
| Chemical name |
2,2'-Diselenobis(4,4-diphenylcyclohexa-2,5-dienone) |
| Formula |
C36 H26 O2 Se2 |
| Calculated formula |
C36 H26 O2 Se2 |
| SMILES |
C1(=O)C(=CC(C=C1)(c1ccccc1)c1ccccc1)[Se][Se]C1=CC(C=CC1=O)(c1ccccc1)c1ccccc1 |
| Title of publication |
2,2'-Diselenobis(4,4-diphenylcyclohexa-2,5-dienone) |
| Authors of publication |
Senthil Kumar, V. S.; Nangia, Ashwini; 2,2'-Diselenobis(4,4-diphenylcyclohexa-2,5-dienone) |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
2000 |
| Journal volume |
56 |
| Journal issue |
1 |
| Pages of publication |
123 - 124 |
| a |
17.4144 ± 0.0016 Å |
| b |
10.6767 ± 0.001 Å |
| c |
15.2187 ± 0.0014 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
2829.6 ± 0.5 Å3 |
| Cell temperature |
168 ± 2 K |
| Ambient diffraction temperature |
168 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
56 |
| Hermann-Mauguin space group symbol |
P c c n |
| Hall space group symbol |
-P 2ab 2ac |
| Residual factor for all reflections |
0.038 |
| Residual factor for significantly intense reflections |
0.031 |
| Weighted residual factors for all reflections |
0.086 |
| Weighted residual factors for significantly intense reflections |
0.081 |
| Goodness-of-fit parameter for all reflections |
1.06 |
| Goodness-of-fit parameter for significantly intense reflections |
1.093 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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