Information card for entry 2010572
| Chemical name |
(1R,2R)-N,N-bis(8-quinoline sulfonylamino)-1,2-diphenylethylenediamine acetone (1\1) |
| Formula |
C35 H32 N4 O5 S2 |
| Calculated formula |
C35 H26.006 N4 O5 S2 |
| SMILES |
O=S(=O)(c1cccc2c1nccc2)N[C@@H]([C@@H](c1ccccc1)NS(=O)(=O)c1cccc2c1nccc2)c1ccccc1.CC(=O)C |
| Title of publication |
(1<i>R</i>,2<i>R</i>)-1,2-Diphenyl-1,2-bis(8-quinolinesulfonylamino)ethylenediamine‒acetone (1/1) |
| Authors of publication |
Dong, Chune; Zhang, Junlong; Zhang, Liangfu; Yu, Zuolong |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
2000 |
| Journal volume |
56 |
| Journal issue |
1 |
| Pages of publication |
e21 - e21 |
| a |
9.717 ± 0.002 Å |
| b |
9.495 ± 0.001 Å |
| c |
17.542 ± 0.003 Å |
| α |
90° |
| β |
97.13 ± 0.01° |
| γ |
90° |
| Cell volume |
1606 ± 0.5 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
4 |
| Hermann-Mauguin space group symbol |
P 1 21 1 |
| Hall space group symbol |
P 2yb |
| Residual factor for all reflections |
0.0415 |
| Residual factor for significantly intense reflections |
0.0319 |
| Weighted residual factors for all reflections included in the refinement |
0.0742 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.944 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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