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Information card for entry 2010740
Preview
| Coordinates | 2010740.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | 4,5-bis[(2-hydroxyethyl)thio]-2-{4,5-bis[(2-hydroxyethyl)thio]-1,3-dithiol-2- ylidene}-1,3-dithiole |
|---|---|
| Formula | C14 H20 B F4 O4 S8 |
| Calculated formula | C14 H20 B F4 O4 S8 |
| SMILES | [B](F)(F)(F)[F-].C1(SC(=C(S1)SCCO)SCCO)=C1SC(=C(S1)SCCO)SCCO |
| Title of publication | 2,3,4,5-Tetrakis[(2-hydroxyethyl)thio]tetrathiafulvalene tetrafluoroborate |
| Authors of publication | Yao, Youxin; Zeng, Wenju; Zhang, Bin; Liu, Yunqi; Zhu, Daoben |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 2000 |
| Journal volume | 56 |
| Journal issue | 3 |
| Pages of publication | e90 - e91 |
| a | 9.707 ± 0.0005 Å |
| b | 11.575 ± 0.0006 Å |
| c | 11.592 ± 0.0007 Å |
| α | 71.333 ± 0.003° |
| β | 85.678 ± 0.004° |
| γ | 73.601 ± 0.003° |
| Cell volume | 1183.58 ± 0.12 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.06 |
| Residual factor for significantly intense reflections | 0.055 |
| Weighted residual factors for all reflections included in the refinement | 0.149 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.075 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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