Information card for entry 2011561
| Chemical name |
1a,2a-Epoxy-24(R)-acyloxycholesta-4,6-dien-3-one hydrate |
| Formula |
C29 H44 O5 |
| Calculated formula |
C29 H44 O5 |
| SMILES |
O=C1[C@@H]2O[C@@H]2[C@]2(C(=C1)C=C[C@@H]1[C@@H]2CC[C@]2([C@H]1CC[C@@H]2[C@H](C)CC[C@H](OC(=O)C)C(C)C)C)C.O |
| Title of publication |
24(<i>R</i>)-Acetyloxy-1α,2α-epoxycholesta-4,6-dien-3-one hydrate. Erratum |
| Authors of publication |
Rajalakshmi, K.; Pattabhi, Vasantha; Venkatesan, C. S.; Nadamuni, G.; Srikrishna, A. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
2000 |
| Journal volume |
56 |
| Journal issue |
11 |
| Pages of publication |
e538 - e538 |
| a |
10.642 ± 0.003 Å |
| b |
11.719 ± 0.002 Å |
| c |
10.977 ± 0.003 Å |
| α |
90° |
| β |
108.04 ± 0.02° |
| γ |
90° |
| Cell volume |
1301.7 ± 0.6 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
4 |
| Hermann-Mauguin space group symbol |
P 1 21 1 |
| Hall space group symbol |
P 2yb |
| Residual factor for all reflections |
0.072 |
| Residual factor for significantly intense reflections |
0.056 |
| Weighted residual factors for all reflections included in the refinement |
0.162 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.123 |
| Diffraction radiation wavelength |
1.5418 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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