Information card for entry 2011604
| Chemical name |
Cis,cis,cis-Tetramethyl 1,2,4,5-cyclohexanetetracarboxylate |
| Formula |
C14 H20 O8 |
| Calculated formula |
C14 H20 O8 |
| SMILES |
O=C(OC)[C@H]1[C@H](C[C@H]([C@H](C1)C(=O)OC)C(=O)OC)C(=O)OC |
| Title of publication |
<i>cis</i>,<i>cis</i>,<i>cis</i>-Tetramethyl 1,2,4,5-cyclohexanetetracarboxylate |
| Authors of publication |
Robinson, Paul D.; Hua, Duy H.; Fan, Jingmei; Liu, Lanzhu; McGill, James W.; Arshid, Mohammed; Meyers, Cal Y. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
2000 |
| Journal volume |
56 |
| Journal issue |
12 |
| Pages of publication |
1471 - 1472 |
| a |
18.6901 ± 0.0019 Å |
| b |
10.031 ± 0.002 Å |
| c |
17.781 ± 0.002 Å |
| α |
90° |
| β |
109.91 ± 0.008° |
| γ |
90° |
| Cell volume |
3134.3 ± 0.8 Å3 |
| Cell temperature |
296 K |
| Ambient diffraction temperature |
296 K |
| Number of distinct elements |
3 |
| Space group number |
15 |
| Hermann-Mauguin space group symbol |
C 1 2/c 1 |
| Hall space group symbol |
-C 2yc |
| Residual factor for all reflections |
0.184 |
| Residual factor for significantly intense reflections |
0.04 |
| Weighted residual factors for all reflections included in the refinement |
0.128 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.958 |
| Diffraction radiation wavelength |
0.71069 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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