Information card for entry 2011984
| Chemical name |
3,3'-[2,2'-(ethylenedioxy)dibenzylidene]bis(S-methyl dithiocarbazate) nickel(II) |
| Formula |
C20 H20 N4 Ni O2 S4 |
| Calculated formula |
C20 H20 N4 Ni O2 S4 |
| SMILES |
[Ni]123SC(SC)=N[N]2=Cc2ccccc2OCCOc2ccccc2C=[N]3N=C(S1)SC |
| Title of publication |
{3,3'-[2,2'-(Ethylenedioxy)dibenzylidene]bis(<i>S</i>-methyl dithiocarbazate)}nickel(II) |
| Authors of publication |
Wu, Jie-Ying; Chantrapromma, Suchada; Chen, Dong-Wen; Tian, Yu-Peng; Yang, Ping; Fun, Hoong-Kun |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
2001 |
| Journal volume |
57 |
| Journal issue |
5 |
| Pages of publication |
523 - 525 |
| a |
11.1188 ± 0.0001 Å |
| b |
7.6413 ± 0.0001 Å |
| c |
27.4773 ± 0.0001 Å |
| α |
90° |
| β |
99.065 ± 0.001° |
| γ |
90° |
| Cell volume |
2305.37 ± 0.04 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.044 |
| Residual factor for significantly intense reflections |
0.033 |
| Weighted residual factors for all reflections included in the refinement |
0.08 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.05 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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