Information card for entry 2014196
| Chemical name |
Tetraaqua(3,4,7,8-tetramethyl-1,10-phenanthroline-κ^2^N,N')zinc(II) thiosulfate |
| Formula |
C16 H24 N2 O7 S2 Zn |
| Calculated formula |
C16 H24 N2 O7 S2 Zn |
| SMILES |
[Zn]1([OH2])([OH2])([OH2])([OH2])[n]2cc(c(c3ccc4c(c(c[n]1c4c23)C)C)C)C.S=S(=O)([O-])[O-] |
| Title of publication |
Tetraaqua(3,4,7,8-tetramethyl-1,10-phenanthroline-κ^2^<i>N</i>,<i>N</i>')zinc(II) thiosulfate |
| Authors of publication |
M. Enriqueta Díaz de Vivar; Sergio Baggio; Andrés Ibañez; Ricardo Baggio |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
2004 |
| Journal volume |
60 |
| Journal issue |
9 |
| Pages of publication |
m451 - m453 |
| a |
9.894 ± 0.002 Å |
| b |
9.887 ± 0.002 Å |
| c |
20.016 ± 0.004 Å |
| α |
90° |
| β |
90.909 ± 0.004° |
| γ |
90° |
| Cell volume |
1957.8 ± 0.7 Å3 |
| Cell temperature |
299 ± 2 K |
| Ambient diffraction temperature |
299 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.1258 |
| Residual factor for significantly intense reflections |
0.0531 |
| Weighted residual factors for significantly intense reflections |
0.1306 |
| Weighted residual factors for all reflections included in the refinement |
0.1407 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.812 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2014196.html