Information card for entry 2014212
| Formula |
C14 H14 Cl4 N5 O2 P3 |
| Calculated formula |
C14 H14 Cl4 N5 O2 P3 |
| SMILES |
ClP1(Cl)=NP(Cl)(Cl)=NP2(=N1)Nc1ccccc1OCCOc1ccccc1N2 |
| Title of publication |
4,4,6,6-Tetrachloro-2,2-(ethylenedioxydi-<i>o</i>-phenylenediimino)-2λ^5^,4λ^5^,6λ^5^-cyclotriphosphazene |
| Authors of publication |
Çaylak, Nagihan; Hökelek, Tuncer; Bilge, Selen; Özgüç, Bilgehan; Kılıç, Zeynel |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
2004 |
| Journal volume |
60 |
| Journal issue |
7 |
| Pages of publication |
o461 - o463 |
| a |
9.045 ± 0.002 Å |
| b |
11.647 ± 0.003 Å |
| c |
12.225 ± 0.002 Å |
| α |
103.663 ± 0.017° |
| β |
107.458 ± 0.019° |
| γ |
109.78 ± 0.02° |
| Cell volume |
1071.1 ± 0.5 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0937 |
| Residual factor for significantly intense reflections |
0.056 |
| Weighted residual factors for significantly intense reflections |
0.1514 |
| Weighted residual factors for all reflections included in the refinement |
0.1724 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.025 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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