Information card for entry 2015492
| Chemical name |
1,4-bis(triisopropylsilyl)buta-1,3-diyne |
| Formula |
C22 H42 Si2 |
| Calculated formula |
C22 H42 Si2 |
| SMILES |
C(#C[Si](C(C)C)(C(C)C)C(C)C)C#C[Si](C(C)C)(C(C)C)C(C)C |
| Title of publication |
1,4-Bis(triisopropylsilyl)buta-1,3-diyne and 1,4-bis(biphenyl-4-yl)buta-1,3-diyne |
| Authors of publication |
Constable, Edwin C.; Gusmeroli, Deborah; Housecroft, Catherine E.; Neuburger, Markus; Schaffner, Silvia |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
2006 |
| Journal volume |
62 |
| Journal issue |
8 |
| Pages of publication |
o505 - o509 |
| a |
7.2397 ± 0.0004 Å |
| b |
7.8151 ± 0.0005 Å |
| c |
10.9548 ± 0.0005 Å |
| α |
86.68 ± 0.005° |
| β |
80.485 ± 0.004° |
| γ |
78.542 ± 0.004° |
| Cell volume |
598.9 ± 0.06 Å3 |
| Cell temperature |
173 K |
| Ambient diffraction temperature |
173 K |
| Number of distinct elements |
3 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0856 |
| Residual factor for significantly intense reflections |
0.0495 |
| Weighted residual factors for all reflections |
0.0738 |
| Weighted residual factors for significantly intense reflections |
0.0537 |
| Weighted residual factors for all reflections included in the refinement |
0.0537 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.0865 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2015492.html