Information card for entry 2015683
| Common name |
cis-(1,10-decamethylenedithio)TTF |
| Chemical name |
2,7-Bis(2-cyanoethylsulfanyl)-3,6-(1,10-decamethylenedithio)tetrathiafulvalene |
| Formula |
C22 H28 N2 S8 |
| Calculated formula |
C22 H28 N2 S8 |
| SMILES |
S1C2SC(=C1SCCC#N)SCCCCCCCCCCSC1=C(SC=2S1)SCCC#N |
| Title of publication |
<i>Cis</i>- and <i>trans</i>-bis(2-cyanoethylsulfanyl)(decane-1,10-diyldithio)tetrathiafulvalene |
| Authors of publication |
Nygaard, Sune; Flood, Amar H.; Jeppesen, Jan O.; Bond, Andrew D. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
2006 |
| Journal volume |
62 |
| Journal issue |
12 |
| Pages of publication |
o677 - o680 |
| a |
5.3573 ± 0.0008 Å |
| b |
18.296 ± 0.003 Å |
| c |
27.041 ± 0.005 Å |
| α |
90° |
| β |
90.753 ± 0.008° |
| γ |
90° |
| Cell volume |
2650.3 ± 0.8 Å3 |
| Cell temperature |
180 ± 2 K |
| Ambient diffraction temperature |
180 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.1407 |
| Residual factor for significantly intense reflections |
0.0539 |
| Weighted residual factors for significantly intense reflections |
0.0962 |
| Weighted residual factors for all reflections included in the refinement |
0.1153 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.979 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2015683.html