Information card for entry 2015747
| Common name |
hexakis(4-cyanophenyl)benzene |
| Chemical name |
4,4',4'',4''',4'''',4'''''-benzenehexaylhexabenzonitrile dichloromethane disolvate |
| Formula |
C50 H28 Cl4 N6 |
| Calculated formula |
C50 H28 Cl4 N6 |
| SMILES |
N#Cc1ccc(cc1)c1c(c2ccc(cc2)C#N)c(c2ccc(cc2)C#N)c(c(c1c1ccc(cc1)C#N)c1ccc(cc1)C#N)c1ccc(cc1)C#N.ClCCl.ClCCl |
| Title of publication |
A new pseudopolymorph of hexakis(4-cyanophenyl)benzene |
| Authors of publication |
Gagnon, Eric; Maly, Kenneth E.; Maris, Thierry; Wuest, James D. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
2007 |
| Journal volume |
63 |
| Journal issue |
1 |
| Pages of publication |
o4 - o6 |
| a |
11.0921 ± 0.0003 Å |
| b |
19.3442 ± 0.0003 Å |
| c |
20.1742 ± 0.0004 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
4328.73 ± 0.16 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
60 |
| Hermann-Mauguin space group symbol |
P b c n |
| Hall space group symbol |
-P 2n 2ab |
| Residual factor for all reflections |
0.0582 |
| Residual factor for significantly intense reflections |
0.0577 |
| Weighted residual factors for significantly intense reflections |
0.1379 |
| Weighted residual factors for all reflections included in the refinement |
0.1382 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.022 |
| Diffraction radiation wavelength |
1.54178 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
Yes |
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