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Information card for entry 2016599
Preview
| Coordinates | 2016599.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | diiodidobis(4-methoxyphenyl)tellurium(II) dimethyl sulfoxide hemisolvate |
|---|---|
| Formula | C15 H17 I2 O2.5 S0.5 Te |
| Calculated formula | C15 H17 I2 O2.5 S0.5 Te |
| Title of publication | Twinning by merohedry in bis(4-methoxyphenyl)tellurium(IV) diiodide dimethyl sulfoxide hemisolvate |
| Authors of publication | Farran, Joan; Alvarez-Larena, Angel; Piniella, Joan F.; Capparelli, Mario V.; Friese, Karen |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 2008 |
| Journal volume | 64 |
| Journal issue | 5 |
| Pages of publication | o257 - o260 |
| a | 9.4309 ± 0.0004 Å |
| b | 9.4309 ± 0.0004 Å |
| c | 38.4799 ± 0.0017 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 2963.9 ± 0.2 Å3 |
| Cell temperature | 296 K |
| Ambient diffraction temperature | 296 K |
| Number of distinct elements | 6 |
| Space group number | 145 |
| Hermann-Mauguin space group symbol | P 32 |
| Hall space group symbol | P 32 |
| Residual factor for all reflections | 0.037 |
| Residual factor for significantly intense reflections | 0.0312 |
| Weighted residual factors for significantly intense reflections | 0.0319 |
| Weighted residual factors for all reflections included in the refinement | 0.0329 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.34 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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