Information card for entry 2020772
| Chemical name |
Tris(ethylenediamine-κ^2^<i>N</i>,<i>N</i>')nickel(II) diacetate |
| Formula |
C10 H30 N6 Ni O4 |
| Calculated formula |
C10 H30 N6 Ni O4 |
| SMILES |
[Ni]123([NH2]CC[NH2]1)([NH2]CC[NH2]2)[NH2]CC[NH2]3.O=C([O-])C.O=C([O-])C |
| Title of publication |
The first-row transition-metal series of tris(ethylenediamine) diacetate complexes [<i>M</i>(en)~3~](OAc)~2~ (<i>M</i> is Mn, Fe, Co, Ni, Cu, and Zn) |
| Authors of publication |
Pham, Duyen N. K.; Roy, Mrittika; Golen, James A.; Manke, David R. |
| Journal of publication |
Acta Crystallographica Section C |
| Year of publication |
2017 |
| Journal volume |
73 |
| Journal issue |
6 |
| Pages of publication |
442 - 446 |
| a |
8.2974 ± 0.0011 Å |
| b |
9.0619 ± 0.0011 Å |
| c |
12.5998 ± 0.0017 Å |
| α |
71.96 ± 0.004° |
| β |
85.204 ± 0.005° |
| γ |
74.321 ± 0.004° |
| Cell volume |
867.3 ± 0.2 Å3 |
| Cell temperature |
200 ± 2 K |
| Ambient diffraction temperature |
200 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0214 |
| Residual factor for significantly intense reflections |
0.0194 |
| Weighted residual factors for significantly intense reflections |
0.0478 |
| Weighted residual factors for all reflections included in the refinement |
0.0491 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.074 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2020772.html