Information card for entry 2021920
| Formula |
C12 H2 F2 N4 |
| Calculated formula |
C12 H2 F2 N4 |
| SMILES |
FC1C(C(F)=CC(=C(C#N)C#N)C=1)=C(C#N)C#N |
| Title of publication |
Insight from electron density and energy framework analysis on the structural features of F x -TCNQ (x = 0, 2, 4) family of molecules |
| Authors of publication |
Shukla, Rahul; Ruzié, Christian; Schweicher, Guillaume; Kennedy, Alan R.; Geerts, Yves H.; Chopra, Deepak; Chattopadhyay, Basab |
| Journal of publication |
Acta Crystallographica Section B Structural Science, Crystal Engineering and Materials |
| Year of publication |
2019 |
| Journal volume |
75 |
| Journal issue |
1 |
| Pages of publication |
71 |
| a |
9.8303 ± 0.0009 Å |
| b |
5.4679 ± 0.0005 Å |
| c |
19.2479 ± 0.0017 Å |
| α |
90° |
| β |
102.417 ± 0.005° |
| γ |
90° |
| Cell volume |
1010.4 ± 0.16 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0798 |
| Residual factor for significantly intense reflections |
0.0509 |
| Weighted residual factors for significantly intense reflections |
0.111 |
| Weighted residual factors for all reflections included in the refinement |
0.124 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.045 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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