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Information card for entry 2023553
Preview
| Coordinates | 2023553.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | 3-[5-(4-Chlorophenyl)-2-sulfanylidene-1,3,4-oxadiazol-3-yl]-3-(4-methylphenyl)-1-(thiophen-2-yl)propan-1-one |
|---|---|
| Formula | C22 H17 Cl N2 O2 S2 |
| Calculated formula | C22 H17 Cl N2 O2 S2 |
| Title of publication | Synthesis, crystal structure and Hirshfeld surface analysis of 3-[5-(4-chlorophenyl)-2-sulfanylidene-1,3,4-oxadiazol-3-yl]-3-(4-methylphenyl)-1-(thiophen-2-yl)propan-1-one |
| Authors of publication | Jain, Shailakshi; Kumar, Sharatha; Hökelek, Tuncer |
| Journal of publication | Acta Crystallographica Section E Crystallographic Communications |
| Year of publication | 2026 |
| Journal volume | 82 |
| Journal issue | 10 |
| a | 20.7798 ± 0.0003 Å |
| b | 13.1963 ± 0.0004 Å |
| c | 16.1047 ± 0.0004 Å |
| α | 90° |
| β | 102.44 ± 0.003° |
| γ | 90° |
| Cell volume | 4312.49 ± 0.19 Å3 |
| Cell temperature | 300 ± 2 K |
| Ambient diffraction temperature | 300 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0845 |
| Residual factor for significantly intense reflections | 0.051 |
| Weighted residual factors for significantly intense reflections | 0.1126 |
| Weighted residual factors for all reflections included in the refinement | 0.1327 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.059 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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