Information card for entry 2100332

Structure parameters

• Formula: Al0.21 Ga1.93 K0.152 O7 Ti1.86
• Calculated formula: Al0.21 Ga1.93 K0.1515 O7 Ti1.86
• Title of publication: X-ray diffraction study for one-dimensional ionic conductors K~<i>x~</i>(Ga~1{-~<i>y</i>}Al~y~)~2+<i>x~</i>Ti~2{-~<i>x</i>}O~7~ (<i>x</i> ≃0.14, <i>y</i> ≃0.10, 0.23, 0.39)
• Authors of publication: Michiue, Yuichi; Yoshikado, Shinzo
• Journal of publication: Acta Crystallographica Section B
• Year of publication: 2005
• Journal volume: 61
• Journal issue: 6
• Pages of publication: 608 - 615
• a: 18.0971 ± 0.0016 Å
• b: 18.0971 ± 0.0016 Å
• c: 2.9916 ± 0.0019 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 979.8 ± 0.6 ų
• Cell temperature: 298 K
• Ambient diffraction temperature: 298 K
• Number of distinct elements: 5
• Space group number: 87
• Hermann-Mauguin space group symbol: I 4/m
• Hall space group symbol: -I 4
• Residual factor for all reflections: 0.0434
• Residual factor for significantly intense reflections: 0.0308
• Weighted residual factors for significantly intense reflections: 0.0486
• Weighted residual factors for all reflections included in the refinement: 0.0506
• Goodness-of-fit parameter for all reflections included in the refinement: 1.1
• Diffraction radiation wavelength: 0.71069 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No