Information card for entry 2103473
| Formula |
C20 H26 Cl2 N3 O5 P3 |
| Calculated formula |
C20 H26 Cl2 N3 O5 P3 |
| SMILES |
C1COCCOCCOCCOP2(=NP(=NP(c3ccccc3)(c3ccccc3)=N2)(O1)Cl)Cl |
| Title of publication |
Structural investigations of phosphorus–nitrogen compounds. 5. Relationships between molecular parameters of 2,2-diphenyl-4,6-<i>cis</i>-oxytetra(ethyleneoxy)-4,6-<i>R</i>~2~-cyclotriphosphazatrienes (<i>R</i> = Cl, OCH~2~CF~3~, OPh, OMe, NHPh, NHBu^<i>t^</i>) and substituent basicity constants |
| Authors of publication |
Beşli, Serap; Coles, Simon J.; Davies, David B.; Hursthouse, Michael B.; Kılıç, Adem; Mayer, Thomas A.; Shaw, Robert A. |
| Journal of publication |
Acta Crystallographica Section B |
| Year of publication |
2002 |
| Journal volume |
58 |
| Journal issue |
6 |
| Pages of publication |
1067 - 1073 |
| a |
17.618 ± 0.004 Å |
| b |
8.1109 ± 0.0016 Å |
| c |
19.284 ± 0.004 Å |
| α |
90° |
| β |
114.44 ± 0.03° |
| γ |
90° |
| Cell volume |
2508.7 ± 1.1 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0614 |
| Residual factor for significantly intense reflections |
0.039 |
| Weighted residual factors for significantly intense reflections |
0.0905 |
| Weighted residual factors for all reflections included in the refinement |
0.1023 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.013 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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